Microscopic Characterisation of Silicon Wafers and Solar Cells

Paul Gundel (Fraunhofer ISE)

SOLAR SEMINAR SERIES

DATE: 2011-03-24
TIME: 15:00:00 - 16:00:00
LOCATION: Ian Ross Seminar Room
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ABSTRACT:
This talk will be about microscopic characterisation techniques for carrier lifetime, stress and doping density measurements on silicon and their application on material defects and technological microstructures such as back surface fields and front side contacts. These micro-photoluminescence and micro-Raman spectroscopy based techniques are applied to measure microscopic defects in multicrystalline wafers and to characterize epitaxial layers as well as process induced damage after laser processing and nickel plating.

BIO:
Paul Gundel has just completed his PhD at Fraunhofer ISE on microscopic characterisation of silicon for solar cells.