Optimizing Micro Raman and PL Spectroscopy for Solar Cell Technological Assessment

Friedemann Heinz (Fraunhofer ISE)

SOLAR SEMINAR SERIES

DATE: 2012-11-08
TIME: 15:00:00 - 16:00:00
LOCATION: Ian Ross Seminar Room
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ABSTRACT:
Significant improvements in the experimental setup of Micro-Raman (IRS) and Micro-Photoluminescence-Spectroscopy (IPL) for solar cell characterization are reported. The lateral resolution of doping density mapping with IRS is improved to below 200 nm. A highly resolved measurement on an aluminum BSF demonstrates the increase in resolution. Furthermore, the characterization of thin silicon layers within the same experimental setup is presented. An excitation source with low penetration depth is used to screen out background signal from the substrate. Finally, a surface topography mapping technique is implemented to extend IRS and IPL to uneven surfaces. With this extension micro cracks in conventionally textured silicon solar cells could be successfully characterized.

BIO: